Ferroelectric and Microscopic Properties of PZT Single Crystal Thin Films

Vanessa Morales

 Mentor: Dr. R. Guo

 

            The research will explore the ferroelectric properties of Lead Zirconium Titanate, Pb(Zr,Ti)O₃, PZT single crystal thin films through various methods of experimentation. PZT is a well-known electroceramic material, but single crystal PZT thin films invites for extensive scientific exploration. The ferroelectric properties that are of main concern are the relative dielectric constant (K) and the dielectric loss (D). The relative dielectric constant, phase transition, and the dielectric loss will be measured utilizing a cryogenic system and the high temperature dielectric equipment available in the Material Research Institute.

            Since the compositions of interest are very close to the morphotropic phase boundary, such study will provide a better understanding of the complex structural and compositional interrelationships in such MPB families. The general study is also valuable for the device performance improvement and for exploration of new devices.